Equipment and Facilities

What it is: An evaluation kit tailored for embedded vision—great for surveillance, ADAS, machine vision, AR, drones, and medical imaging.

Why it’s powerful: Built on the ZU7EV MPSoC, combining CPUs, GPU, hardware video codec, and FPGA fabric on one chip for real-time, low-latency processing.

Key specs: • Quad Arm Cortex-A53 (applications) + Dual Cortex-R5 (real-time) • Mali-400 MP2 GPU • Hardware H.264/H.265 codec up to 4K@60fps • 16nm FinFET+ programmable logic for custom acceleration • Rich peripherals/interfaces for vision sensors and I/O

Summary: A one-board platform to prototype and deploy high-performance, low-power vision AI at the edge.

What it is: Flagship Versal AI Core (VC1902) evaluation kit for ultra-high-throughput AI inference and signal processing from cloud to edge.

Why it stands out • Up to 100× compute vs. server-class CPUs (targeted workloads) • 400 AI Engines + 1,968 DSP Engines • Dual-core Arm® Cortex-A72 (apps) + Dual-core Cortex-R5F (real-time) • ~1.97M logic cells (~900k LUTs), 28 programmable NoC ports • 4 integrated memory controllers, 770 max I/O pins

Use cases: Data-center acceleration, 5G/DFE, cable-access head-end, wireless test, ADAS/automotive, A&D radar/early warning.

Summary: A reconfigurable, AI-engine–powered platform delivering the Versal portfolio’s highest AI/DSP throughput for cloud, network, and edge solutions.

What it is: A compact evaluation board for rapid embedded-system prototyping using Zynq-7000 SoCs (CPU + FPGA on one chip).

Why it stands out • Ships with reference designs, IP, and tools for fast bring-up • Demonstrates an embedded video pipeline out of the box • 1 GB DDR3 component memory for applications and buffering • Dual Arm® Cortex-A9 processors plus programmable logic for acceleration

Use cases: Embedded vision, industrial control, networking prototypes, and edge compute demos where a CPU+FPGA platform accelerates real-time tasks.

Summary: All-in-one CPU+FPGA (Zynq-7000) board for fast embedded prototypes—dual Cortex-A9, 1 GB DDR3, Ethernet/HDMI/FMC—ideal for quick bring-up of vision, control, and edge applications.

What it is: A 40 Gb/s connectivity and prototyping platform based on the Virtex-7 VX690T FPGA, built for high-bandwidth networking and serial-I/O designs.

Why it stands out • Turnkey bring-up with reference designs, IP, and tools • 10GBASE-R demo to external DDR3 • Dual 4 GB DDR3 SODIMMs (up to 933 MHz / 1866 Mb/s) • Rich high-speed I/O: PCIe Gen3 x8, 4× SFP/SFP+, SMA, UART • FMC mezzanine expansion • Supports MicroBlaze soft 32-bit RISC for embedded control

Device highlights (XC7VX690T-2FFG1761C) • ~693k logic cells • 3,600 DSP slices • ~52.9 Mb on-chip memory (52,920 Kb) • 80 GTH transceivers @ 13.1 Gb/s • 1,000 I/O pins

Use cases: 10/40 GbE packet processing, high-speed serial protocol development, storage/networking accelerators, and lab test equipment.

What it is: An RFSoC-based evaluation kit for rapid 5G/RF system prototyping—ideal for massive-MIMO radios, IF transceivers, radar, satcom, and RF test gear.

Why it stands out • Comes with integrated RF design examples • Add-on cards for fast bring-up & measurement: o XM650 16T16R N79 loopback card (quick loopback tests) o XM655 16T16R breakout card (in-depth performance measurements) o CLK104 RF clock card: internal up to 1.2 GHz, external up to 10 GHz reference clocking

Target applications • 5G sub-6 GHz massive-MIMO • 5G mmWave IF transceivers • Fixed wireless access • Digital phased-array radar • Terrestrial satellite communications • Spectrum analyzers & high-speed RF testers

Summary: A ready-to-measure RF lab on a board—memory, clocks, and I/O tuned for building and validating high-throughput 5G/RF systems fast.

The DE1-SoC is an Intel/Altera development board built around the Cyclone V SoC (5CSEMA5F31C6), combining an FPGA fabric with a dual-core ARM Cortex-A9 Hard Processor System (HPS). This heterogeneous architecture supports everything from basic digital logic labs to multimedia and embedded Linux projects, with about 85K logic elements, 4,450 Kbits of on-chip memory, multiple PLLs, and hard memory controllers for high-performance designs.

For development and storage, the board includes an EPCS128 configuration device, an on-board USB Blaster II for programming/debug, 64 MB SDRAM connected to the FPGA, 1 GB DDR3 for the HPS, and a microSD card socket for OS/images. It also provides rich I/O and peripherals: Gigabit Ethernet, USB 2.0 host ports, UART-to-USB, PS/2, IR, and multiple expansion options including two 40-pin 3.3V headers, a 10-pin ADC header, and an LTC connector exposing SPI, I²C, and GPIO.

The board is well suited for signal acquisition and multimedia projects thanks to a 24-bit VGA DAC, a 24-bit audio CODEC (line-in/line-out/mic), and a TV decoder with composite TV-in. It also features an 8-channel, 12-bit ADC (500 KSPS, 0–4.096 V), user I/O (keys, switches, LEDs, six 7-segment displays), an onboard G-sensor, and is powered via a 12 V DC input.

BRICSS offers a neuromorphic dynamic vision System on Chip (SoC) with integrated sensing and compute made possible with Dynamic Vision Sensor (DVS) and processor. It is fully asynchronous with no global clock signal and an always on profile (no wake-up procedures) with a resting power of 0.42 mW.

The kit comes with a complete software toolchain, including data management, model simulation and host management.

Our group is currently performing algorithmic and application-specific benchmarking by exploring different classes of Spiking Neural Network workloads across a variety of network architectures to determine performance metrics such as latency, throughput, and power.

The low power capability of this neuromorphic chip can be beneficial for edge devices that span a range of research applications, including but not limited to wearable health monitoring devices, autonomous vehicle sensors, and other IoT applications.

BRICCS offers a low-power neuromorphic processing platform, designed for event-driven signal processing using Spiking Neural Networks (SNNs). The platform is optimized for temporal and rate-based encoding of continuous-time signals and supports fully asynchronous computation without a global clock, enabling ultra-low power operation suitable for always-on sensing applications.

The Development Kit consists of an neuromorphic processor daughterboard mounted on an FPGA-based motherboard, which provides flexible interfacing, data streaming, and host communication. The system is primarily intended for real-time processing of temporal signals such as audio streams, sensor-derived time series, and other continuous biological or physical signals that can be encoded into spike trains.

Our group uses the platform to explore event-based representations and regime-change detection in slow biological and chemical processes, including growth dynamics, metabolic activity proxies, and longitudinal biosensing signals. Rather than focusing on high-precision numerical inference, the emphasis is on detecting state transitions, temporal patterns, and dynamic responses under constrained power budgets.

The energy-efficient and event-driven nature of the architecture makes it well suited for edge intelligence applications where continuous monitoring, low latency response, and minimal power consumption are critical. Representative application domains include biosignal monitoring, liquid biopsy signal preprocessing, adaptive laboratory instrumentation, and embedded decision modules for portable sensing devices.

The Tello is a compact, lightweight quadcopter (about 80 g with propellers and battery) measuring 98 × 92.5 × 41 mm and using 3-inch propellers, making it easy to carry and fly indoors or outdoors in calm conditions. It includes a vision system, range finder, barometer, LED, and 2.4 GHz 802.11n Wi-Fi, and supports 720p live view; charging is via a micro-USB port.

In flight, Tello can reach up to 100 m range, 8 m/s top speed, about 13 minutes of flight time, and a maximum height of 30 m, powered by a detachable 1.1 Ah / 3.8 V battery. Its camera captures 5 MP photos (2592 × 1936) and HD 720p/30 fps video with an 82.6° field of view, saving media as JPG and MP4, and it includes electronic image stabilization (EIS) for smoother footage.

The DE10-Nano Self-Balancing Robot Development Kit is a hands-on platform built around the Terasic DE10-Nano (Intel Cyclone V SoC FPGA) that demonstrates how FPGA logic can create application-tailored I/O and real-time control. The robot uses the board’s on-board accelerometer (and a 6-axis MEMS motion sensor on the motor driver board) to maintain balance, while FPGA/HPS resources integrate motor control and multiple sensing/communication functions such as ultrasonic distance measurement, IR detection, and Bluetooth/Wi-Fi connectivity. With an optional camera add-on and an FPGA design developed using the license-free Intel HLS compiler, the kit can also perform color-based object tracking and following, making it ideal for customization and experimentation.

On the compute side, the HPS provides an 800 MHz dual-core Arm Cortex-A9, 1 GB DDR3, Gigabit Ethernet, USB OTG, and microSD storage, plus UART-to-USB and reset/user controls. The FPGA fabric (Cyclone V SE 5CSEBA6U23I7, ~110K LEs) supports expansion and prototyping through dual 40-pin headers, an Arduino Uno R3–compatible header, and an analog input header with an SPI A/D converter, along with onboard programming via USB-Blaster II and video output via HDMI TX. The included motor driver board adds DC motor drivers and connectors, IR receiver, ultrasonic interface, power monitoring, and regulated power distribution (12 V input, 5 V output to the FPGA board) to complete a robust robotics development stack.

The A-Cute Car is an FPGA-based three-wheeled robotic car kit. This car can provide higher operation performance than the MCU based robotic car, because the FPGA provides more powerful computing power than the MCU.

The car is driven by two DC motors. It can move in any direction, by changing the speed and direction of each wheel by changing the speed and direction of the two DC motors. The car is equipped with a sensor board which contains seven line tracking sensors by implementing the line following function. The car also contains a power convert system so the car can be driven by 3.3V~12V battery pack. The car contains an IR receiver so that the car can be remotely controlled with the IR controller included in the car kit. Buzzers and lamps are equipped just for fun.

The car contains a 2x20 GPIO expansion header and a 2x6 TMD expansion header. The 2x6 TMD expansion header can be expanded with the Terasic Bluetooth module BTS-TMD, so the car can be remotely controlled with a Bluetooth device, e.g. Android Cell Phone. Besides the hardware, the car kit also includes open source examples. Based on the example codes, developers can quickly implement their application designs.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Advanced ASIC Testing System

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Advanced ASIC Testing System

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.

Our state-of-the-art ASIC testing facility provides comprehensive verification and validation capabilities for integrated circuit designs. Equipped with high-precision measurement instruments and advanced signal analysis tools, this system enables thorough characterization of semiconductor devices under various operating conditions and environmental parameters.

The testing platform supports multiple protocols and interfaces, allowing researchers to conduct performance benchmarking, reliability assessments, and failure analysis. With automated test sequencing and real-time data acquisition capabilities, our facility accelerates the development cycle while ensuring the highest standards of quality and accuracy in semiconductor research.